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Development of a novel planar mesh type micro-magnetic sensor for the quality inspection of electroplated materials

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1 Author(s)
S. C. Mukhopadhyay ; Inst. of Inf. Sci. & Technol., Massey Univ., New Zealand

The development work of a novel planar mesh type micro-magnetic sensor for the quality inspection of electroplated materials has been reported in this paper. The sensor is suitable for inspecting the quality of electroplated materials. The results obtained from the analytical model for the calculation of transfer impedance of the sensor have been discussed. The transfer impedance is used for the quality inspection of electroplated materials in an indirect way. The experimental results are reported which confirm the validity of the analytical model.

Published in:

Sensors, 2002. Proceedings of IEEE  (Volume:2 )

Date of Conference:

2002