Cart (Loading....) | Create Account
Close category search window
 

Measurements of optical loss in GaAs/Al/sub 2/O/sub 3/ nonlinear waveguides in the infrared using femtosecond scattering technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Moutzouris, K. ; Sch. of Phys. & Astron., Univ. of St. Andrews, UK ; Venugopal Rao, S. ; Ebrahimzadeh, M. ; De Rossi, A.
more authors

Summary from only given. We measured the loss coefficient for GaAs/Al/sub 2/O/sub 3/ waveguides in the telecommunication window (near 1.5 /spl mu/m) and near 2.0 /spl mu/m, where these waveguides are proven to be strong candidates for nonlinear frequency conversion. Using the scattering technique and femtosecond pulses for the first time the losses were evaluated for semiconductor waveguides over an extended wavelength range from 1.3 to 2.1 /spl mu/m.

Published in:

Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the

Date of Conference:

24-24 May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.