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Multilevel testability analysis and solutions for integrated Bluetooth transceivers

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3 Author(s)
Ozev, S. ; Comput. Eng. Dept., Univ. of California, San Diego, CA, USA ; Orailoglu, A. ; Olgaard, C.V.

As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components

Published in:

Design & Test of Computers, IEEE  (Volume:19 ,  Issue: 5 )