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Neighborhood selection for IDDQ outlier screening at wafer sort

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4 Author(s)
Daasch, W.R. ; Integrated Circuits Design & Test Lab., Portland State Univ., OR, USA ; McNames, James ; Madge, R. ; Cota, K.

To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers

Published in:

Design & Test of Computers, IEEE  (Volume:19 ,  Issue: 5 )

Date of Publication:

Sep-Oct 2002

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