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IDDQ test: will it survive the DSM challenge?

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2 Author(s)
Sabade, S.S. ; Texas A&M Univ., TX, USA ; Walker, D.M.H.

Deep-submicron technologies pose difficult challenges for IDDQ testing in the future. The low threshold voltage used by DSM devices decreases the defect resolution of IDDQ. However, because IDDQ is a valuable test method, researchers are working to augment with other test parameters to prolong its effectiveness

Published in:

Design & Test of Computers, IEEE  (Volume:19 ,  Issue: 5 )