Cart (Loading....) | Create Account
Close category search window
 

Electrical noise generated from the microphonic effect in capacitors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nelson, R. ; Dept. of Electr. & Comput. Eng., North Dakota State Univ., Fargo, ND, USA ; Davidson, L.

Passive components such as capacitors and inductors are often used in high-frequency circuits. EM engineers often model the frequency response of these components by adding "parasitic" components to the circuit model. For instance, parasitic resistors and inductors are added to the model of a capacitor. Some capacitors also exhibit an electrical response when stressed physically. This response can be significant. This response is called the "microphonic effect" because the frequency of the response is often in the audible range. A simple operational amplifier circuit is used to examine this response for several off-the-shelf capacitors. Considerable variation is observed-depending on capacitor type, capacitor size, and physical location.

Published in:

Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on  (Volume:2 )

Date of Conference:

19-23 Aug. 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.