Skip to Main Content
Questions about the validity of measurements made in an E3 laboratory using software to control the instrumentation are a continuing concern for EMC engineers. In previous work, it has been shown that the use of statistical process control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system hardware setup, and in the data it produces. Once the hardware system stability has been demonstrated, it is possible to also utilize SPC historical information to assist in confirming the validity of the data gathered using the system's control software.
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on (Volume:2 )
Date of Conference: 19-23 Aug. 2002