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E3 software verification through the use of statistical process control methods

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1 Author(s)
Williams, K. ; Underwriters Labs. Inc., Southfield, MI, USA

Questions about the validity of measurements made in an E3 laboratory using software to control the instrumentation are a continuing concern for EMC engineers. In previous work, it has been shown that the use of statistical process control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system hardware setup, and in the data it produces. Once the hardware system stability has been demonstrated, it is possible to also utilize SPC historical information to assist in confirming the validity of the data gathered using the system's control software.

Published in:
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on  (Volume:2 )

Date of Conference: 19-23 Aug. 2002

Page(s):
788 - 790 vol.2
Print ISBN:
0-7803-7264-6
INSPEC Accession Number:
7509784
Conference Location :
Minneapolis, MN, USA
Digital Object Identifier :
10.1109/ISEMC.2002.1032694

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