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Field extraction from near field scanning for a microstrip structure

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9 Author(s)
Lin Zhang ; Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA ; Slattery, K.P. ; Chen Wang ; Yamaguchi, M.
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Currents associated with high-speed digital devices have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.

Published in:

Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on  (Volume:2 )

Date of Conference:

19-23 Aug. 2002