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Analysis of radiation caused by LSI package cross talk and cable by using the time-domain moment method

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3 Author(s)
S. Ohtsu ; Corporate Component Eng. Center, Fujitsu Ltd., Kawasaki, Japan ; K. Nagase ; T. Yamagajou

We have developed the direct time-domain moment method, which is applicable to arbitrarily shaped models made of conductors and dielectrics. Using the method, we have analyzed the cross talk phenomenon within a LSI package. We have shown that, in the PCB with the LSI and a cable, the noise induced by the cross talk causes the strong radiation through the cable. Still more we have shown a remedy for the cross talk by simulations.

Published in:

Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on  (Volume:1 )

Date of Conference:

19-23 Aug. 2002