Analysis of radiation caused by LSI package cross talk and cable by using the time-domain moment method

We have developed the direct time-domain moment method, which is applicable to arbitrarily shaped models made of conductors and dielectrics. Using the method, we have analyzed the cross talk phenomenon within a LSI package. We have shown that, in the PCB with the LSI and a cable, the noise induced by the cross talk causes the strong radiation through the cable. Still more we have shown a remedy for the cross talk by simulations.