By Topic

Fast and compact error correcting scheme for reliable multilevel flash memories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rossi, D. ; Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy ; Metra, C. ; Ricco, B.

This paper presents a method to reduce area and timing overhead due to the implementation of standard single symbol correcting codes to provide multilevel (ML) flash memories with error correction ability. In particular the proposed method is based on the manipulation of the parity check matrix which defines a code, which allows us to minimize the matrix weight and the maximum row weight. Furthermore, we show that a minimal increase in the redundancy, with respect to the standard case, allows a further considerable reduction of the impact on the memory access time, as well as on the area overhead due to the error correction circuitry.

Published in:

On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International

Date of Conference: