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Estimation of thin-oxide reliability using proportional hazards models

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2 Author(s)
Elsayed, E.A. ; Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA ; Chan, C.K.

Proportional hazards models for estimating thin-oxide dielectric reliability and time-dependent dielectric-breakdown hazard rates are developed. Two groups of models are considered: group one ignores interactions between temperature and electric field, while group two considers several forms of interactions. The inclusion of interaction is not statistically significant at the 1% level. An analysis of the Hokari time-dependent dielectric-breakdown data, in terms of the form of the electric-field acceleration factor, shows that the approach of I.C. Chen et al. (1985) is more appropriate than the approach of D.L. Crook (1979)

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Reliability, IEEE Transactions on  (Volume:39 ,  Issue: 3 )