Cart (Loading....) | Create Account
Close category search window
 

Estimation of thin-oxide reliability using proportional hazards models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Elsayed, E.A. ; Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA ; Chan, C.K.

Proportional hazards models for estimating thin-oxide dielectric reliability and time-dependent dielectric-breakdown hazard rates are developed. Two groups of models are considered: group one ignores interactions between temperature and electric field, while group two considers several forms of interactions. The inclusion of interaction is not statistically significant at the 1% level. An analysis of the Hokari time-dependent dielectric-breakdown data, in terms of the form of the electric-field acceleration factor, shows that the approach of I.C. Chen et al. (1985) is more appropriate than the approach of D.L. Crook (1979)

Published in:

Reliability, IEEE Transactions on  (Volume:39 ,  Issue: 3 )

Date of Publication:

Aug 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.