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Enhanced reliability for gate dielectric of low-temperature polysilicon thin-film transistors by NO-plasma nitridation

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4 Author(s)
Or, D.C.T. ; Dept. of Electr. & Electron. Eng., Hong Kong Univ., China ; Lai, P.T. ; Sin, J.K.O. ; Xu, J.P.

Polysilicon thin-film transistors (poly-Si TFTs) fabricated solely by low-temperature processes (under 600°C) are treated with nitridation using NO plasma. Their properties are investigated at room temperature under high-field stress. It is found that the plasma is effective in improving the gate-oxide hardness against stress-induced damage, with the nitrided device showing a smaller shift in threshold voltage, a smaller decrease in peak transconductance and a smaller increase in subthreshold slope after the stress. This result shows that plasma nitridation has positive effects on the reliability of low-temperature-fabricated poly-Si TFTs, which play an important role nowadays in low-cost flat-panel display systems on glass.

Published in:

Electron Devices Meeting, 2002. Proceedings. 2002 IEEE Hong Kong

Date of Conference:

2002

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