Referenced Items are not available for this document.
This article looks at the state of BIT (built-in-test) in test and measurement instruments, explains BIT's effect on system readiness, and presents ideas on how to improve BIT technologies and standards. The following topics are discussed: circuit level BIT (built-in self-test); module level and line replaceable units (LRU); system-level self-contained testing; instrumentation BIT history; BIT fault coverage and isolation in support system maintenance; BIT development process; pitfalls and limitations of BIT; BIT effectiveness in support system maintenance and availability.
Published in:
Instrumentation & Measurement Magazine, IEEE
(Volume:5
,
Issue:
3
)
Date of Publication: Sep 2002
- Page(s):
- 25 - 29
- ISSN :
- 1094-6969
- INSPEC Accession Number:
- 7382164
- Digital Object Identifier :
- 10.1109/MIM.2002.1028369
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 November 2002
- Issue Date :
- Sep 2002
- Sponsored by :
- IEEE Instrumentation and Measurement Society
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