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Fault diagnosis of electronic system using artificial intelligence

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3 Author(s)
Fenton, B. ; Ulster Univ., UK ; McGinnity, M. ; Maguire, L.

With increasing system complexity, shorter product life cycles, lower production costs, and changing technologies, the need for intelligent tools for all stages of a product's lifecycle is becoming increasingly important. The purpose of this article is to give a brief review how AI has been used in the field of electronic fault diagnosis. Topics discussed include: rule-based diagnostic systems; model-based diagnostic systems; case-based reasoning (CBR); fuzzy reasoning and artificial neural networks (ANN); hybrid approaches; IEEE diagnostic standards and automated diagnostic tool future developments.

Published in:

Instrumentation & Measurement Magazine, IEEE  (Volume:5 ,  Issue: 3 )

Date of Publication:

Sep 2002

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