Cart (Loading....) | Create Account
Close category search window

A comparison-based approach to multicomputer system diagnosis in hybrid fault situations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kozlowski, W.E. ; Inst. of Comput. Sci., Tech. Univ. of Gdansk, Poland ; Krawczyk, H.

A comparison-based system-level fault diagnosis model is considered. Provided the number of faulty units and the number of incorrect outcomes (in the sense that a fault-free unit evaluates a faulty one to be fault-free) do not exceed given bounds, the necessary and sufficient conditions for the comparison assignment to achieve correct and complete diagnosis are determined. An O(n| E|) fault identification algorithm and optimal comparison assignments, in terms of minimum time of complete fault localization, are also proposed. The proposed diagnosis strategy can be performed concurrently with application tasks execution and the suitable comparison assignment can minimize the latency of fault identification. It makes the model more attractive for real-time applications

Published in:

Computers, IEEE Transactions on  (Volume:40 ,  Issue: 11 )

Date of Publication:

Nov 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.