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On the nonenumerative path delay fault simulation problem

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2 Author(s)
D. Kagaris ; Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA ; S. Tragoudas

The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this nonenumerative problem. A polynomial time pessimistic algorithm which returns higher coverage than algorithms with the same order of complexity and at the same time compacts the test set is also presented

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:21 ,  Issue: 9 )