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A new approach to evaluation of hot-carrier lifetime of ring oscillator (RO)

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2 Author(s)
Jiong Zhang ; Conexant Syst. Inc., Newport Beach, CA, USA ; Shao-Fu Sanford Chu

The paper presents a novel experimental method to evaluate AC hot-carrier lifetime of a ring oscillator (RO). By using a series of different stages of ring oscillators (DSROs), the new method allows one to maintain a constant frequency (f0) and obtain a closer value between pulse-to-pulse voltage (Vp-p) and bias condition throughout the RO lifetime testing. These two achievements eliminate the innate flaws in conventional RO hot-carrier test method. Hence, a more reliable AC lifetime of RO is expected

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Electron Devices, IEEE Transactions on  (Volume:49 ,  Issue: 9 )