Referenced Items are not available for this document.
The paper presents a novel experimental method to evaluate AC hot-carrier lifetime of a ring oscillator (RO). By using a series of different stages of ring oscillators (DSROs), the new method allows one to maintain a constant frequency (f0) and obtain a closer value between pulse-to-pulse voltage (Vp-p) and bias condition throughout the RO lifetime testing. These two achievements eliminate the innate flaws in conventional RO hot-carrier test method. Hence, a more reliable AC lifetime of RO is expected
Published in:
Electron Devices, IEEE Transactions on
(Volume:49
,
Issue:
9
)
Date of Publication: Sep 2002
- Page(s):
- 1672 - 1674
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 7377103
- Digital Object Identifier :
- 10.1109/TED.2002.802660
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 November 2002
- Issue Date :
- Sep 2002
- Sponsored by :
- IEEE Electron Devices Society
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