By Topic

Far-field pattern determination from the near-field amplitude on two surfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Bucci, O.M. ; Dipartimento di Elettronica, Naples Univ., Italy ; D'Elia, G. ; Leone, G. ; Pierri, R.

The possibility of determining the far field of radiating systems by measuring only the near-field amplitude is investigated. The main difficulties of the problem are examined in some detail and a new near-field/far-field transformation technique is developed, based on the measurement of the near-field amplitude over two surfaces surrounding the antenna under test. The accuracy of the far-field reconstruction results are related both to the distance between such surfaces and to some a priori information concerning the near-field phase and/or the radiating system. The information on the radiating system allows relaxation of the need for any information on the near-field phase provided that the distance between the measurement surfaces is high enough. Conversely, the knowledge of a more or less corrupted near-field phase allows reduction of such distances without affecting the accuracy of the far-field reconstruction. Numerical examples validating the effectiveness of the developed algorithm are provided for the planar scanning case

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:38 ,  Issue: 11 )