By Topic

Land cover classification of polarimetric synthetic aperture radar (POLSAR) data based on scattering mechanisms and complex Wishart distribution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
K. Y. Lee ; Centre for Remote Imaging, Sensing & Process., Nat. Univ. of Singapore, Singapore ; Soo Chin Liew ; Leong Keong Kwoh

The use of C- and L-band polarimetric synthetic aperture radar (POLSAR) data for classifying land cover features in a tropical area is investigated in this study. The POLSAR data were acquired during the NASA/JPL PACRIM-1 mission over the northern part of Peninsular Malaysia on 3rd December 1996. Prior to classification, the Lee polarimetric filter was applied to the complex covariance matrix for speckle suppression. In unsupervised classification, the scattering mechanism of each pixel in the speckle-suppressed images was analyzed and grouped into one of the three categories: (1) odd-bounce, (2) even-bounce, or (3) diffuse scattering. Training samples were then generated from the outputs of the unsupervised classification, to be used in subsequent supervised classifications of various frequency and polarization combinations. The Kappa statistics computed for classification using single-frequency fully polarized C- and L-band data were 0.69 and 0.73, respectively. An improvement to 0.79 was achieved by using the dual-frequency (combined C and L bands), fully polarized data in the classification.

Published in:

Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International  (Volume:5 )

Date of Conference:

2002