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Numerical tools for simulation of radiated emission testing and its application in uncertainty studies

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1 Author(s)
van Dijk, N. ; EMC Competence Center, Philips Electron., Eindhoven, Netherlands

Radiated emission measurements are used to test whether electronic products comply with certain EMC emission requirements. Stimulated by the need to reduce uncertainties, the radiated emission measurement is subject to modification by the EMC standardization body CISPR. Simulation tools are very useful in supporting such modifications. In this paper, we evaluate the use of numerical tools based on the method of moments (MoM) for the simulation of radiated emission testing. We also examine whether such a tool is capable for performing parameter variation studies. For this parameter study, we focus on height and distance variations of the equipment under test (EUT). The results of the parameter study are validated by measurements. The influence of EUT height or distance variations is predicted very well by numerical tools.

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Electromagnetic Compatibility, IEEE Transactions on  (Volume:44 ,  Issue: 3 )