Cart (Loading....) | Create Account
Close category search window
 

Time-resolved measurements of excited state densities in a copper vapor laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Brown, D. ; Dept. of Phys., New England Univ., Armidale, NSW, Australia ; Kunnemeyer, R. ; McIntosh, A.I.

Time-resolved measurements of copper and neon buffer gas excited-state densities in a copper vapor laser (CVL) during the excitation pulse and early afterglow are reported for both optimum and nonoptimum power-input conditions. The optimum condition results demonstrate that the termination of the laser pulse in the CVL is due not only to filling of the lower laser level, but also to a reduction in the upper laser-level pumping related to the collapse of power input to the plasma during the excitation pulse. Time-resolved measurements of excited-state densities over a wide range of input-power conditions clearly illustrate that the increase in copper density with power input reduces the peak electron temperature in the plasma during the excitation pulse. This reduction in peak electron temperature is important in limiting the scaling of CVL output power with input-power-copper density

Published in:

Quantum Electronics, IEEE Journal of  (Volume:26 ,  Issue: 9 )

Date of Publication:

Sep 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.