Cart (Loading....) | Create Account
Close category search window
 

Analysis of power recycling techniques for RF and microwave outphasing power amplifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xuejun Zhang ; Center for Wireless Commun., California Univ., San Diego, La Jolla, CA, USA ; Larson, L.E. ; Asbeck, P.M. ; Langridge, R.A.

A power recycling technique has been analyzed for efficiency-enhanced radio-frequency (RF) and microwave outphasing power amplifiers for mobile wireless communications. By use of a simple power recycling network, a considerable portion of the wasted power can be recovered back to the power supply, and the enhancement of the overall power efficiency can be achieved without sacrificing the high-linearity performance of the amplifier system. An analysis and calculations have been conducted to optimize the recycling network for maximum power efficiency. The results predict a significant improvement on the overall power efficiency of the amplifier system for various modulations.

Published in:

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on  (Volume:49 ,  Issue: 5 )

Date of Publication:

May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.