Cart (Loading....) | Create Account
Close category search window
 

Second order local analysis for 3D reconstruction of specular surfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Savarese, S. ; California Inst. of Technol., Pasadena, CA, USA ; Min Chen ; Perona, P.

We analyze the problem of recovering the shape of a mirror surface. A calibrated scene composed of lines passing through a point is assumed. The lines are reflected by the mirror surface onto the image plane of a calibrated camera, where the intersection, orientation and curvature of such reflections are measured. The relationship between the local geometry of the surface around the point of reflection and the measurements is analyzed. We extend the analysis in Savarese and Perona. (2001, 2002), where we recovered positions and normals and second order local geometry of a specular surface up to one unknown parameter. We show that, provided that we work in a neighborhood of a surface whose third order surface terms can be neglected, the second order parameter ambiguity can be solved by equating the curvatures observed for the reflected lines with those computed from analytical differentiation followed by a perspective projection.

Published in:

3D Data Processing Visualization and Transmission, 2002. Proceedings. First International Symposium on

Date of Conference:

2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.