Cart (Loading....) | Create Account
Close category search window

An algorithm with reduced operations for connected components detection in ITU-T group 3/4 coded images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Regentova, E. ; Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA ; Latifi, S. ; Deng, S. ; Dongsheng Yao

An algorithm, which performs connected components detection in the course of decoding ITU-T (former CCITT) facsimile Group 3/4, i.e., MH/MR/MMR compressed images is presented. New definitions of mode color and a new transition element are introduced that allow MR/MMR codes to analyze and derive information about connection of black runs in two adjacent scan lines in the course of decoding. The experiments on the standard set of eight CCITT documents have shown that, on the average, the complexity of direct processing of MR/MMR codes is lower by a factor of 20 and 2.5 than that for raster images and MH codes processing respectively. Data structures for image vector description are discussed.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:24 ,  Issue: 8 )

Date of Publication:

Aug 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.