Cart (Loading....) | Create Account
Close category search window
 

Stopping sets and the girth of Tanner graphs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Orlitsky, A. ; Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA ; Urbanke, R. ; Viswanathan, K. ; Zhang, J.

Recent work has related the error probability of iterative decoding over erasure channels to the presence of stopping sets in the Tanner graph of the code used. In particular, it was shown that the smallest number of uncorrected erasures is the size of the graph's smallest stopping set. Relating stopping sets and girths, we consider the size σ(d,g) of the smallest stopping set in any bipartite graph of girth g and left degree d. For g≤8 and any d, we determine σ(d,g) exactly. For larger gs we bound σ(d,g) in terms of d, showing that for fixed d, σ(d,g) grows exponentially with g. Since constructions of high-girth graphs are known, one can therefore design codes with good erasure-correction guarantees under iterative decoding.

Published in:

Information Theory, 2002. Proceedings. 2002 IEEE International Symposium on

Date of Conference:

2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.