Cart (Loading....) | Create Account
Close category search window
 

Small-signal and temperature noise model for MOSFETs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Pascht, A. ; Inst. of Electr. & Opt. Commun. Eng., Stuttgart Univ., Germany ; Grozing, Markus ; Wiegner, D. ; Berroth, M.

The present CMOS technology provides n-channel MOSFETs with a transit frequency beyond 30 GHz, which are attractive for RF integrated circuits, e.g., low-noise amplifiers. This paper presents an improved deembedding procedure for extraction of parasitic elements of MOSFETs. The extraction determines the intrinsic elements of the small-signal equivalent circuit. As a result, a new method to determine the gate capacitance is presented. This deembedding procedure is based on an analytical solution of the equations and facilitates the determination of the elements at any specific frequency. Moreover, a temperature noise model is presented, which is based on the small-signal equivalent circuit with an analytical description of the channel noise. This enables a complete noise modeling of all four noise parameters and the determination of the dominant noise sources. Finally, the noise-figure measurements are compared with the simulation results.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:50 ,  Issue: 8 )

Date of Publication:

Aug 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.