IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Electronics Letters ...> Volume:38 Issue:14 Help

Simultaneous refractive index and temperature measurement using cascaded long-period grating in double-cladding fibre

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Gwandu, B.A.L. ; Dept. of Electron. Eng., Aston Univ., Birmingham ; Shu, X. ; Allsop, T.D.P. ; Zhang, W.
more authors

A compact scheme for simultaneous temperature and surrounding refractive index (SRI) measurement using two long-period gratings (LPGs) of different periods inscribed side-by-side in a single piece of a double-cladding fibre is presented. One of the LPGs is sensitive to both SRI and temperature, whilst the second is sensitive to temperature only

Published in:
Electronics Letters  (Volume:38 ,  Issue: 14 )

Date of Publication: 4 Jul 2002

Page(s):
695 - 696
ISSN :
0013-5194
INSPEC Accession Number:
7338038
Digital Object Identifier :
10.1049/el:20020498
Product Type:
Journals & Magazines
Date of Current Version :
07 August 2002
Issue Date :
4 Jul 2002
Sponsored by :
Institution of Engineering and Technology

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.