Referenced Items are not available for this document.
The programmable cores on SoCs can perform on-chip test generation, measurement, response analysis, and even diagnosis. This software-based approach to self-testing enables at-speed testing and incurs low DFT overhead. We give an overview of the existing embedded software-based self-testing and self-diagnosis methods for core-based SoC designs, and we discuss the challenges to further developing this new testing paradigm
Published in:
Design & Test of Computers, IEEE
(Volume:19
,
Issue:
4
)
Date of Publication: Jul/Aug 2002
- Page(s):
- 18 - 27
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 7331627
- Digital Object Identifier :
- 10.1109/MDT.2002.1018130
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 August 2002
- Issue Date :
- Jul/Aug 2002
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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