Cart (Loading....) | Create Account
Close category search window
 

A path analysis approach to concurrent program testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yang, R.-D. ; Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan ; Chyan-Goei Chung

A path analysis approach to concurrent program testing is proposed. A concurrent path model for modeling the execution behavior of a concurrent program is presented. In the model, an execution of a concurrent program is seen as involving a concurrent path (which comprises the paths of all concurrent tasks), and the tasks' synchronizations are modeled as a concurrent route to traverse the concurrent path involved in the execution. Accordingly, testing is a process to examine the correctness of each concurrent route along all concurrent paths of concurrent programs. On the basis of the model, the test format is defined, and a path analysis testing methodology is presented. Also, several coverage criteria, extended from coverage criteria for sequential programs, are proposed. Some practical issues of path analysis testing, namely, test path generation, test data generation, and design of the test execution control mechanism are also addressed

Published in:

Computers and Communications, 1990. Conference Proceedings., Ninth Annual International Phoenix Conference on

Date of Conference:

21-23 Mar 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.