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A genetic based algorithm for voltage flicker measurement

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2 Author(s)
W. M. Al-Hasawi ; College of Technological Studies, Kuwait ; K. M. El-Naggar

Measurements of voltage flicker levels and its frequency is of great concern to the utility in order to prevent unacceptable voltage fluctuation in the supplying system. This paper introduces a new digital approach for the measurements of voltage flicker and its frequency using the genetic algorithm (GAs) optimization technique. The algorithm is tested using simulated data. Effects of number of samples, sampling frequency and the sample window size are studied. Effects of GAs parameters and. operators, such as population size, crossover, mutation probabilities, niching and fitness functions are also studied. Results are reported and discussed.

Published in:

Electrotechnical Conference, 2002. MELECON 2002. 11th Mediterranean

Date of Conference:

2002