Close category search window
 

An improved correlated double sampling circuit for low noise charge coupled devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wey, H. ; Inst. fuer Elecktronik, ETH-Zentrum, Zurich, Switzerland ; Guggenbuhl, W.

Correlated double sampling (CDS) is discussed as a signal processing method to reduce low-frequency amplifier noise and kTC noise of sampled systems. The different noise contributions in a typical CCD output stage and their transformation through a CDS circuit are discussed. An improved CDS method (CDS2) is presented that completely eliminates the pixel crosstalk and kTC-noise contribution, but maintains a low noise bandwidth. The noise reduction achieved with the method lies in the range of 3-8 dB, with the lower limit valid for white noise and the upper limit for pixel crosstalk and kTC noise. The improved CDS circuit approaches optimum filtering of the combined noise spectrum. From the hardware point of view only one additional switch is required. Measured values with an experimental CCD output stage and CDS setup are shown to confirm the theory

Published in:
Circuits and Systems, IEEE Transactions on  (Volume:37 ,  Issue: 12 )

Date of Publication: Dec 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.