By Topic

Design of sapphire rod resonators to measure the surface resistance of high temperature superconductor films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
T. Hashimoto ; Dept. of Electr. & Electron. Syst., Saitama Univ., Japan ; Y. Kobayashi

Sapphire rod resonators of three types, as proposed in the IEC/TC90/WG8, have been commonly used to measure the surface resistance R/sub s/ of high temperature (high-T/sub c/) superconducting (HTS) films. One is called an open-type resonator, where a sapphire rod having diameter D and length L is placed between two parallel HTS films, and the other is called a closed-type resonator, where the sapphire rod is set in a cavity constructed from two HTS films and a copper ring having diameter d and height h. Some mode charts for these resonators are calculated from the rigorous analysis based on the mode matching method, taking account of an uniaxial-anisotropic characteristic of a sapphire rod. An optimum dimension of a sapphire rod resonator is designed from the mode charts so as to separate the TE/sub 011/ mode from the other modes. Moreover, it is verified that the radiations of the leaky state TM modes influence the unloaded Q/sub u/ values of the open-type resonator. As a result, the closed-type sapphire resonator having a dimension ratio X/sup 2/=(D/L)/sup 2/ of 4 and diameter ratio S=d/D of 4 should be used.

Published in:

Microwave Symposium Digest, 2002 IEEE MTT-S International  (Volume:3 )

Date of Conference:

2-7 June 2002