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Variation in proton-induced upsets rates from large solar flares using an improved SEU model

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2 Author(s)
Normand, E. ; Boeing Aerosp. & Electron., Seattle, WA, USA ; Stapor, William J.

Proton integral flux measurements during solar energetic particle (SEP) events, from the CPME instrument onboard the IMP-8 satellite, and the proton detector on the GOES-7 satellite, are utilized to calculate proton-induced single-event upset (SEU). An improved two-parameter SEU cross section model is used for three RAM devices. The log of the 239 actual RAM upsets on the TDRS-1 satellite during the October 19, 1989 SEP event allowed a comparison between the recorded number of upsets/chip per day and those predicted based on the GOES-7 data, the two-parameter model, and the shielding distribution curve

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Nuclear Science, IEEE Transactions on  (Volume:37 ,  Issue: 6 )