By Topic

A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Siew-Leng Teng ; Blk 151, Singapore, Singapore ; Kwee-Poo Yeo

A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation

Published in:

Reliability, IEEE Transactions on  (Volume:51 ,  Issue: 2 )