Close category search window
 

Filters designed for testability wrapped on the Mixed-Signal Test Bus

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Calvano, J.V. ; Brazilian Navy Res. Inst., Brazil ; Alves, V. ; Lubaszewski, M. ; Mesquita, A.C.

This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1st order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.

Published in:
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.