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Performance comparison of VLV, ULV, and ECR tests [biomedical IC product]

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2 Author(s)
Wanli Jiang ; Test Eng., Guidant Corp., St. Paul, MN, USA ; Peterson, E.

Very-Low-Voltage, Ultra-Low-Voltage (a modified version of Minimum-Voltage), and Energy Consumption Ratio (a recently developed test metric) tests are applied as supplemental tests along with existing traditional tests to a biomedical IC product. The effectiveness and efficiency of these supplemental tests are evaluated and compared with some major traditional tests. The effectiveness analysis indicates that Ultra-Low-Voltage and Energy Consumption Ratio tests identified potentially defective devices from good devices. The efficiency analysis shows that the Energy Consumption Ratio test is much more efficient than Very-Low-Voltage, Ultra-Low-Voltage and major traditional tests.

Published in:

VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE

Date of Conference:

2002