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CMOS charge pumps using cross-coupled charge transfer switches with improved voltage pumping gain and low gate-oxide stress for low-voltage memory circuits

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5 Author(s)
Kyeong-Sik Min ; Center for Collaborative Res., Univ. of Tokyo, Japan ; Young-Hee Kim ; Jin-Hong Ahn ; Jin-Yong Chung
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To overcome the problems of the modified Dickson pump like NCP-2, a new pump (CCTS-1) where simple voltage doublers are cascaded in series and each of them has cross-coupled configuration is studied in this paper for possible use in low-voltage EEPROMs and DRAMs. Though this concept of cascading doublers has been previously proposed, it is firstly addressed in this paper that CCTS-1 has the lower gate-oxide stress, the improved voltage pumping gain, and the better power efficiency than NCP-2 so that CCTS-1 can be more suitable for the multi-stage pump in particular at low VCC. In addition, CCTS-2 is proposed to overcome the degraded body-effect of CCTS-1 without using boosted clocks when the stage number is large.

Published in:

Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on  (Volume:5 )

Date of Conference:

2002