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Practical solutions for the application of the oscillation-based-test in analog integrated circuits

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5 Author(s)
Vazquez, D. ; Instituto de Microelectron. de Sevilla, Univ. de Sevilla, Spain ; Huertas, G. ; Leger, G. ; Rueda, A.
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This paper presents practical solutions for solving the problems arising when applying the oscillation-based-test to analog integrated circuits. It is devoted to discussing a practical on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.

Published in:

Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on  (Volume:1 )

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