Cart (Loading....) | Create Account
Close category search window

AM noise impact on low level phase noise measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cibiel, G. ; Lab. d''Autom. et d''Anal. des Syst., CNRS, Toulouse, France ; Regis, M. ; Tournier, E. ; Llopis, O.

The influence of the source AM noise in microwave residual phase noise experiments is investigated. The noise floor degradation problem, caused by the parasitic detection of this type of noise by an imperfectly balanced mixer, is solved thanks to a refinement of the quadrature condition. The parasitic noise contribution attributable to the AM to PM (phase modulation) conversion occurring in the device under test is minimized through the development of a dedicated microwave source featuring an AM noise level as low as -170 dBc/Hz at 10 kHz offset from a 3.5 GHz carrier.

Published in:

Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

June 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.