IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Microwave and Optoelectronics ... Help

Low cost network analyzer using a six-port reflectometer

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
de Sousa, F.Rangel ; ENST, Paris, France ; Huyart, B. ; Freire, R.C.S.

This paper presents a simple system for measurement of complex ratio between two RF signals that can be applied to measurement of reflection coefficient of a network port or exhibit the constellation diagram of phase-modulated signals. The system is based on a six-port reflectometer and digital signal processing.

Published in:
Microwave and Optoelectronics Conference, 2001. IMOC 2001.Proceedings of the 2001 SBMO/IEEE MTT-S International  (Volume:1 )

Date of Conference: 2001

Page(s):
145 - 147 vol.1
Print ISBN:
0-7803-7065-1
INSPEC Accession Number:
7386399
Digital Object Identifier :
10.1109/SBMOMO.2001.1008738
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.