Referenced Items are not available for this document.
A linear time complexity algorithm to test RAMs is presented. The algorithm requires only 7 n read/write operations and provides an extensive fault coverage. The main advantage of the proposed scheme is that a small test time can be achieved.
Published in:
Electronics Letters
(Volume:27
,
Issue:
7
)
Date of Publication: 28 March 1991
- Page(s):
- 574 - 575
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 3901022
- Digital Object Identifier :
- 10.1049/el:19910362
- Date of Current Version :
- 06 August 2002
- Issue Date :
- 28 March 1991
- Sponsored by :
- Institution of Engineering and Technology
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