By Topic

High speed X-ray imaging camera for time resolved diffraction studies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
S. V. Tipnis ; Radiat. Monitoring Devices Inc., Watertown, MA, USA ; V. V. Nagarkar ; V. Gaysinskiy ; S. R. Miller
more authors

We report here on a high-speed X-ray imaging camera, specifically developed for time resolved diffraction studies using synchrotron and laboratory X-ray sources. This camera is capable of acquiring six X-ray images at speeds of up to 2300 frames per second (fps). The system is based on a modified architecture charge coupled device (CCD) optically coupled to a fiberoptic taper via an image intensifier. The front end of the taper is coupled to a specially designed microstructured CsI(Tl) scintillator screen capable of providing high light output, very high detection efficiency, and excellent spatial resolution. In addition to the time resolved diffraction studies, this detector will be extremely valuable in applications such as dynamic imaging of small animals, X-ray microtomography, and materials science applications. This paper discusses the design and performance characterization of the imaging system. Additionally, we present some preliminary high-speed X-ray imaging data obtained using laboratory X-ray sources.

Published in:

Nuclear Science Symposium Conference Record, 2001 IEEE  (Volume:1 )

Date of Conference:

4-10 Nov. 2001