Cart (Loading....) | Create Account
Close category search window

Improvements on the duality based method used in solving optimal power flow problems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ch'i-Hsin Lin ; Dept. of Electron. Eng., KaoYuan Inst. of Technol., Kaoshiung, Taiwan ; Shin-Yeu Lin ; Shieh-Shing Lin

To improve the previously developed dual-type (DT) method used in solving optimal power flow (OPF) problems with large number of thermal-limit constraints, the authors propose two new techniques in this paper. The first one is a graph-method based decomposition technique which can decompose the large-dimension projection problem, caused by the large number of thermal-limit constraints, into several independent medium-dimension projection subproblems at the expense of slight increment of the dual problem's dimension. The second technique is an active-set strategy based DT method which can solve the medium-dimension projection subproblems efficiently. They have used the DT method embedded with these two new techniques in solving numerous OPFs with large number of thermal-limit constraints. The test results show that the proposed techniques are very efficient and effectively improve the DT method for handling large number of thermal-limit constraints

Published in:

Power Systems, IEEE Transactions on  (Volume:17 ,  Issue: 2 )

Date of Publication:

May 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.