By Topic

Detection and localization of inter-turn fault in the HV winding of a power transformer using wavelets [Comments and authors' reply]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

We discuss the paper by M.R. Rao and B.P. Singh (ibid. vol. 8, pp. 652-567, 2001) describing a wavelet approach for identification and localization of "minor" or "small" faults within HV transformer windings during lightning impulse tests on them. Although the authors' claim appear to be impressive, there are serious questions regarding the circuit models and computational procedures used, as well as, in the interpretation of the results obtained from the wavelet method. Therefore, the following is intended to obtain clarification from the authors and to help the reader with the usage of wavelets in addressing such problems

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:9 ,  Issue: 3 )