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Change of dielectric property with water-treed region

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4 Author(s)
Nakamura, S. ; Dept. of Electron., Mie Univ., Tsu, Japan ; Ozaki, T. ; Ito, N. ; Kawai, J.

By dividing a water-treed XLPE sheet sample into a non-degraded layer and a water-treed one, relative permittivity εr2' and dielectric loss factor εr2" of the water-treed layer have been estimated using an equivalent circuit. The way of changes in εr2' and εr2" with the water tree length r estimated by the pulsed electroacoustic method has been discussed based on a Maxwell-Wagner-Sillars (MWS) model. It has been concluded that the MWS model gives a reasonable fit to the experimental data providing that the water conductivity in voids lies between 1×10-3 S/m and 8×10-3 S/m, and the minor and major axis ratio of the ellipsoids, to which water-filled voids are compared, lies in the range of 1:20 to 1:50

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Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:9 ,  Issue: 3 )