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Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

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8 Author(s)
Niewczas, P. ; Strathclyde Univ., Glasgow, UK ; Dziuda, L. ; Fusiek, G. ; Willshire, A.J.
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In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.

Published in:

Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE  (Volume:2 )

Date of Conference:

2002

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