Close category search window
 

Effect of the finite memory length of a recorder in evaluating its frequency response of from step response

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Fiorentin, P. ; Dipt. di Ingegneria Elettrica, Universita degli Studi di Padova, Italy

The length of the record containing the step response of a system affects the estimate of the frequency response obtained from it by the DFT algorithms. An evaluation of the error due to the record truncation is presented in a theoretical case. The amplitude of this error is particular significant when small aberration (of the order of few percentage) of the response is considered. A criterion of obtaining the frequency response of a system based on two or more records of the step response acquired with different sampling frequencies is presented. The quantification of the errors in this estimate is discussed, in particular for the low frequency sampled records. The presented method is applied to experimental data to estimate the frequency response of an oscilloscope.

Published in:
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE  (Volume:1 )

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.