Cart (Loading....) | Create Account
Close category search window
 

Automatic partitioning of parallel loops with parallelepiped-shaped tiles

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rastello, F. ; ST Microelectron., Grenoble, France ; Robert, Y.

In this paper, an efficient algorithm to implement loop partitioning is introduced and evaluated. We start from results of Agarwal et al. (1995) whose aim is to minimize the number of accessed data throughout the computation of a tile; this number is called the cumulative footprint of the tile. We improve these results along several directions. First, we derive a new formulation of the cumulative footprint, allowing for an analytical solution of the optimization problem stated by Agarwal et al.. Second, we deal with arbitrary parallelepiped-shaped tiles, as opposed to rectangular tiles. We design an efficient heuristic to determine the optimal tile shape in this general setting and we show its usefulness using both examples of Agarwal et al. and a large collection of randomly generated data

Published in:

Parallel and Distributed Systems, IEEE Transactions on  (Volume:13 ,  Issue: 5 )

Date of Publication:

May 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.