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Summary form only given. Specular spin-valves with nano-oxide layers (NOLs) demonstrated large giant-magnetoresistance (GMR) ratio up to 16% and are being used as the sensor layer in the high magnetic recording heads. It was found that the GMR ratio and exchange bias field is very sensitive to nano-oxide layer quality and its process the techniques and conditions. A detailed structural characterization of NOL and the spin-valve structures is very important in order to understand the structure and magnetic correlation in such specular spin-valves. This work presents a systematic structural characterization of NOL and specular spin-valves using low and high-angle X-ray diffraction and high-resolution transmission electron microscopy.