By Topic

Patterned-electron-beam magnetic tomography technique for observing a magnetic field distribution generated by a magnetized material

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
H. Suzuki ; Central Res. Lab., Hitachi Ltd., Tokyo, Japan ; T. Shimakura ; K. Nakamura

Summary form only given. We have previously reported a technique for mapping a magnetic field distribution over the air-bearing surface of a recording head, see Suzuki et al. (2000, 1998). This technique uses modified transmission electron microscopy and computer processing to produce a three-dimensional intensity profile of a magnetic head field. We demonstrate an improved magnetic sensitivity of this technique and us it to analyze a magnetic vector distribution generated by a sub-micrometer-square area of a magnetized material.

Published in:

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Date of Conference:

April 28 2002-May 2 2002